Ambitions and vision
Nearfield Instruments (NFI) advances the semiconductor industry with its high-precision metrology tools, particularly through its QUADRA and AUDIRA systems. These systems offer high-throughput, three-dimensional scanning probe microscopy that achieves atomic-scale resolution. This technology is vital for modern semiconductor manufacturing because it enables detailed examination of semiconductor wafers at the atomic level, allowing manufacturers to detect and analyze defects and irregularities that could affect the performance of semiconductor devices.
The ability to conduct these inspections quickly ("high-throughput") and with extreme precision is crucial for maintaining the quality and reliability of semiconductors, which are fundamental components of electronic devices. This capability directly supports advancements in technology and ensures the production efficiency necessary to meet the demands of rapidly evolving electronic markets. NFI’s commitment to sustainability is integrated into their R&D and operational processes, aiming to reduce environmental impact. They strive for continuous innovation, underpinned by values of trust and empowerment, to push the boundaries of nano-electronics manufacturing technologies.
Technical fields
Nearfield Instruments' core technology is built around three main principle. Frist, Wave Interaction Understanding, they focus on how electromagnetic and mechanical waves interact with matter at the nano-scale. Then Mechatronics and Optics by translating this fundamental understanding into practical instruments through advanced mechatronics and optics. They also use Customer Collaboration align their research with specific industry needs. They actively demonstrate the applicability of their technology in real-world scenarios from early development phases, ensuring their solutions address the market's current and future challenges effectively.
Their key products are specialized metrology tools for the semiconductor industry. First, they offer QUADRA, a high-throughput 3D scanning probe microscope designed for advanced semiconductor manufacturing, capable of atomic-scale resolution. It's particularly useful for critical dimension and defect inspection across a semiconductor wafer. They also developed AUDIRA which is a tool that extends the capabilities of QUADRA by offering advanced metrology features for three-dimensional characterization at the nanoscale, suitable for both R&D and production environments. These products work by utilizing advanced scanning probe microscopy techniques to provide detailed, three-dimensional measurements of semiconductor surfaces at the nanometer scale, critical for ensuring the quality and efficacy of semiconductor devices.